Original paper
Total Internal Reflection Peak Force Infrared Microscopy
Abstract
Total internal reflection (TIR) infrared spectroscopy is a convenient measurement tool for collecting spectra for chemical identification. However, TIR infrared microscopy lacks high spatial resolution due to the optical diffraction limit and difficulty to preserve a high-quality wave front for focus. In this article, we present the peak force infrared microscopy in the TIR geometry to achieve a 10 nm spatial resolution. Instead of optical...
Paper Details
Title
Total Internal Reflection Peak Force Infrared Microscopy
Published Date
Dec 10, 2020
Journal
Volume
93
Issue
2
Pages
731 - 736
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Notes
History