Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode

Scattering-type scanning near-field optical microscopy (s-SNOM) enables nanoscale spectroscopic imaging and has been instrumental for many nano-photonic discoveries and in situ studies. However, conventional s-SNOM techniques with atomic force microscopy tapping mode operation and lock-in detections do not provide direct tomographic information with explicit tip-sample distance. Here, we present a non-traditional s-SNOM technique, named peak...