Simulation of Pulsed Laser-Induced Testing in Microelectronic Devices

A method to carry out a priori simulations of pulsed laser-induced single event effects experiments is reported. Nonlinear optical simulations are conducted to model three-dimensional distributions of charge from a laser pulse. These pulsed laser-induced charge distributions are then incorporated into a charge transport solver to model the movement of charge as the device returns to a steady state. The output of the simulation infrastructure is...