Peakforce Infrared Micoscopy: Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multipulse Peak Force Infrared Microscopy (Advanced Optical Materials 5/2020)

The combination of atomic force microscopy and infrared radiation provides a route for nanoscale mapping of phonon polaritons in 2D materials. In article number 1901084, Xiaoji G. Xu and co-workers demonstrate a photothermal-based technique – peakforce infrared (PFIR) microscopy – that can detect phonon polaritons in h-BN, as an affordable and simple alternative to scattering scanning near-field optical microscopy. Multi-pulse PFIR further...