Plasmonic hole ejection involved in plasmon-induced charge separation

Volume: 5, Issue: 4, Pages: 597 - 606
Published: Jan 1, 2020
Abstract
Hot hole ejection from the resonance sites of plasmonic nanoparticles on a semiconductor or an electrode enables oxidation at more positive potentials, output of higher voltage, and site-selective photo-oxidation beyond the diffraction...
Paper Details
Title
Plasmonic hole ejection involved in plasmon-induced charge separation
Published Date
Jan 1, 2020
Volume
5
Issue
4
Pages
597 - 606
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