Clustered DNA Damage Induced by 2–20 eV Electrons and Transient Anions: General Mechanism and Correlation to Cell Death

Volume: 10, Issue: 11, Pages: 2985 - 2990
Published: May 17, 2019
Abstract
The mechanisms of action of low-energy electrons (LEEs) generated in large quantities by ionizing radiation constitute an essential element of our understanding of early events in radiolysis and radiobiology. We present the 2–20 eV electron energy dependence of the yields of base damage (BD), BD-related cross-links (CLs), and non-double-strand break (NDSB) clustered damage induced in DNA. These new yield functions are generated by the impact of...
Paper Details
Title
Clustered DNA Damage Induced by 2–20 eV Electrons and Transient Anions: General Mechanism and Correlation to Cell Death
Published Date
May 17, 2019
Volume
10
Issue
11
Pages
2985 - 2990
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