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Original paper

Electronic transport in planar atomic-scale structures measured by two-probe scanning tunneling spectroscopy

Volume: 10, Issue: 1
Published: Apr 5, 2019
Abstract
Miniaturization of electronic circuits into the single-atom level requires novel approaches to characterize transport properties. Due to its unrivaled precision, scanning probe microscopy is regarded as the method of choice for local characterization of atoms and single molecules supported on surfaces. Here we investigate electronic transport along the anisotropic germanium (001) surface with the use of two-probe scanning tunneling spectroscopy...
Paper Details
Title
Electronic transport in planar atomic-scale structures measured by two-probe scanning tunneling spectroscopy
Published Date
Apr 5, 2019
Volume
10
Issue
1
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