Validation of Lifetime Prediction of IGBT Modules Based on Linear Damage Accumulation by Means of Superimposed Power Cycling Tests

Volume: 65, Issue: 4, Pages: 3520 - 3529
Published: Sep 13, 2017
Abstract
In this paper, the lifetime prediction of power device modules based on the linear damage accumulation is studied in conjunction with simple mission profiles of converters. Superimposed power cycling conditions, which are called simple mission profiles in this paper, are made based on a lifetime model in respect to junction temperature swing duration. This model has been built based on 39 power cycling test results of 600-V 30-A...
Paper Details
Title
Validation of Lifetime Prediction of IGBT Modules Based on Linear Damage Accumulation by Means of Superimposed Power Cycling Tests
Published Date
Sep 13, 2017
Volume
65
Issue
4
Pages
3520 - 3529
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