Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties

Volume: 109, Issue: 11
Published: Jun 1, 2011
Abstract
Contact resonance AFM characterization techniques rely on the dynamics of the cantilever as it vibrates while in contact with the sample. In this article, the dependence of the quality factor of the vibration modes on the sample properties is shown to be a complex combination of beam and sample properties as well as the applied static tip force. Here the tip-sample interaction is represented as a linear spring and viscous dashpot as a model for...
Paper Details
Title
Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties
Published Date
Jun 1, 2011
Volume
109
Issue
11
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