Spray pyrolysis

Raman spectroscopy

Engineering

Pyrolysis

Electrochemistry

Metallurgy

Materials science

Chromatography

Cyclic voltammetry

Chemical engineering

Band gap

Cerium

Physical chemistry

Supercapacitor

Physics

Nanotechnology

Crystallite

Optics

Manganese

Doping

Thin film

Analytical Chemistry (journal)

Horizontal scan rate

Chemistry

Electrode

Optoelectronics

Journal of Rare Earths

The present work aimed to investigate the electrochemical properties of ITO substrates in propylene carbonate (PC) with 0.5 mol/L lithium perchlorate (LiClO 4 ) medium in the presence of elaborated thin films of cerium dioxide pure and doped with manganese at varying percentages. Ce 1– x Mn x O 2 ( x = 0 wt%, 2 wt%, 4 wt% and 6 wt%) were successfully deposited by the spray pyrolysis (SP) technique on the glass substrate and ITO at 450 °C. The effects of manganese (Mn) doped thin films Ce 1– x Mn x O 2 were studied and investigated by using different analyses namely X-ray diffraction (XRD) analysis, Raman spectroscopy method, UV–Vis spectrophotometer technique, atomic force microscopy (AFM) analysis and electrochemical properties. XRD data obtained present a polycrystalline with a face-centred cubic structure of fluorite type. Raman results of undoped and Mn doped thin films show two peaks at 465 and 600 cm −1 , due to the formation of extrinsic oxygen vacancies by the incorporation of Mn into Ce 1– x Mn x O 2 matrix. Energy dispersive spectroscopy (EDS) data show the presence of Ce, O, and Mn elements in the elaborated films. The AFM results reveal that the surface roughness decreases with increasing Mn rate. Further, band gap energy of thin films decreases with increasing in Mn rate due to the formation of defect state between valence and conduction band. The storage capacity of the elaborated Ce 1– x Mn x O 2 /ITO/PC + LiClO 4 electrode reaches a maximum of 1.997 mF in the presence of 6 wt% of Mn. CV plots for ITO, pure and 6 wt% Mn doped CeO 2 film.

Influence of manganese rate on structural, optical and electrochemical properties of CeO2 thin films deposited by spray pyrolysis: Supercapacitor applications