Original paper
Optical microscopy–based thickness estimation in thin GaSe flakes
Abstract
null null We have implemented three different optical methods to quantitatively assess the thickness of thin GaSe flakes transferred on both transparent substrates, like Gel-Film, and SiO2/Si substrates. We show how their apparent color can be an efficient way to make a quick, rough estimation of the thickness of the flakes. This method is more effective for SiO2/Si substrates as the thickness-dependent color change is more pronounced on these...
Paper Details
Title
Optical microscopy–based thickness estimation in thin GaSe flakes
Published Date
Jun 1, 2021
Journal
Volume
10
Pages
100143
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Notes
History