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doi.org/10.1145/3417330
Original paper
Test Selection for Deep Learning Systems
W. F. Mader
123
,
Mike Papadakis
35
,
...,
Yves Le Traon
55
View all 5 authors
ACM Transactions on Software Engineering and Methodology
6.60
Volume: 30, Issue: 2, Pages: 1 - 22
Published
: Jan 3, 2021
68
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Paper Fields
Machine learning
Test suite
Chemistry
Programming language
Retraining
Chromatography
Artificial intelligence
Set (abstract data type)
Selection (genetic algorithm)
Deep learning
Sample (material)
Business
International trade
Test case
Model selection
Data mining
Computer science
Regression analysis
Paper Details
Title
Test Selection for Deep Learning Systems
DOI
doi.org/10.1145/3417330
Published Date
Jan 3, 2021
Journal
ACM Transactions on Software Engineering and Methodology
Volume
30
Issue
2
Pages
1 - 22
Notes
History
View all history