Dual beam-shear differential interference microscopy for full-field surface deformation gradient characterization

We propose a new experimental mechanics method: dual beam-shear differential interference microscopy (DInM) for full-field surface deformation measurement. The method integrates the principles of differential interference contrast, photoelasticity, digital image correlation and the theories of continuum mechanics for a 4D quantification of the surface topography. Our first DInM prototype provides the lateral resolution of 787nm for up to 12%...