Error estimation and enhanced stiffness sensitivity in contact resonance force microscopy with a multiple arbitrary frequency lock-in amplifier (MAFLIA)

In contact resonance force microscopy and related dynamic atomic force microscopy methods, an accurate description of the real-time cantilever dynamics is essential to the mapping of local material properties, such as viscoelasticity, piezo response, and chemical composition. Stiffness and damping variations of the tip-sample contact result in variations in the cantilever's resonance frequency and quality factor as it scans a sample of interest....