Analysis of cracked functionally graded piezoelectric material using XIGA

In this paper, an extended isogeometric analysis (XIGA) is presented to model the crack in functionally graded piezoelectric materials (FGPMs). The material properties of functionally graded piezoelectric material (FGPM) vary in an exponential manner along the length of the domain. To model a crack in the FGPM, the isogeometric analysis (IGA) approximation is enriched with the Heaviside and crack tip enrichment functions. Conventional four-fold...