Determination of thermal properties of some sulfide thin films using electropyroelectric method

This paper presents a simple theoretical model of a nondestructive electropyroelectric technique in front configuration to easily determine all static and dynamic thermal parameters of semiconductors sulfides thin films. The suitability of the method was demonstrated with investigations on several binary and sulfides (NiS and Sb2S3) and ternary ones (ZnIn2S4 and CuInS2). The validity of our theoretical approaches was investigated by determining...