This website uses cookies.
We use cookies to improve your online experience. By continuing to use our website we assume you agree to the placement of these cookies.
To learn more, you can find in our Privacy Policy.
Other

Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction

Volume: 162, Pages: 55 - 66
Published: Sep 25, 2018
Abstract
No abstract.
Paper Details
Title
Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction
Published Date
Sep 25, 2018
Volume
162
Pages
55 - 66
© 2025 Pluto Labs All rights reserved.
Step 1. Scroll down for details & analytics related to the paper.
Discover a range of citation analytics, paper references, a list of cited papers, and more.