Original paper
Super-resolution visible photoactivated atomic force microscopy
Abstract
Imaging the intrinsic optical absorption properties of nanomaterials with optical microscopy (OM) is hindered by the optical diffraction limit and intrinsically poor sensitivity. Thus, expensive and destructive electron microscopy (EM) has been commonly used to examine the morphologies of nanostructures. Further, while nanoscale fluorescence OM has become crucial for investigating the morphologies and functions of intracellular specimens, this...
Paper Details
Title
Super-resolution visible photoactivated atomic force microscopy
Published Date
May 4, 2017
Journal
Volume
6
Issue
11
Pages
e17080 - e17080
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Notes
History