Original paper

Photoinduced force microscopy: A technique for hyperspectral nanochemical mapping

Volume: 56, Issue: 8S1, Pages: 08LA04 - 08LA04
Published: Jul 26, 2017
Abstract
Advances in nanotechnology have intensified the need for tools that can characterize newly synthesized nanomaterials. A variety of techniques has recently been shown which combines atomic force microscopy (AFM) with optical illumination including tip-enhanced Raman spectroscopy (TERS), scattering-type scanning near-field optical microscopy (sSNOM), and photothermal induced resonance microscopy (PTIR). To varying degrees, these existing...
Paper Details
Title
Photoinduced force microscopy: A technique for hyperspectral nanochemical mapping
Published Date
Jul 26, 2017
Volume
56
Issue
8S1
Pages
08LA04 - 08LA04
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