Abstract
Photo-induced force microscopy is a novel technique where mechanical detection with a cantilevered probe replaces the detection of photons to investigate optically induced processes and states. A theoretical and experimental analysis is performed here of the forces present in photo-induced force microscopy operated in tapping mode, which reveals two dominant optically induced forces, the gradient force and the scattering force. Force-distance...
Paper Details
Title
Ultrafast Photo-induced Force Microscopy
Published Date
Jan 1, 2014
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Notes
History