The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

Volume: 126, Pages: 36 - 43
Published: Mar 1, 2017
Abstract
The contribution of 180° domain wall motion to polarization and dielectric properties of ferroelectric materials has yet to be determined experimentally. In this paper, an approach for estimating the extent of (180°) domain reversal during application of electric fields is presented. We demonstrate this method by determining the contribution of domain reversal to polarization in soft lead zirconate titanate during application of strong electric...
Paper Details
Title
The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
Published Date
Mar 1, 2017
Volume
126
Pages
36 - 43
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