Viscoelastic Property Mapping with Contact Resonance Force Microscopy
Abstract
We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For...
Paper Details
Title
Viscoelastic Property Mapping with Contact Resonance Force Microscopy
Published Date
Nov 4, 2011
Journal
Volume
27
Issue
23
Pages
13983 - 13987
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