Original paper
Loss tangent imaging: Theory and simulations of repulsive-mode tapping atomic force microscopy
Abstract
An expression for loss tangent measurement of a surface in amplitude modulation atomic force microscopy is derived using only the cantilever phase and the normalized cantilever amplitude. This provides a direct measurement of substrate compositional information that only requires tuning of the cantilever resonance to provide quantitative information. Furthermore, the loss tangent expression incorporates both the lost and stored energy into one...
Paper Details
Title
Loss tangent imaging: Theory and simulations of repulsive-mode tapping atomic force microscopy
Published Date
Feb 13, 2012
Journal
Volume
100
Issue
7
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Notes
History