2D Characterization of OPV from Single and Tandem Cells to Fully Roll-to-Roll Processed Modules with and without Electrical Contact

A new type of light beam‐induced current 2D mapping system is developed that speeds up acquisition time from hours and days to minutes or even seconds. It is particularly relevant as a tool to characterize printed, large‐scale, organic photovoltaics. Defects inherent to the multi‐layer printing or degradation effects that develop later can be detected with a spatial resolution of <100 μm. It can be used as an in‐line characterization element...