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Thin film

Analytical Chemistry (journal)

Mass spectrometry

Chemistry

Composition (language)

X-ray

Analytica Chimica Acta

Two procedures are described for calculating the composition and mass thickness of thin samples from measured x-ray intensities. One procedure is suitable for use with a programmable hand calculator but gives correct results only for very thin samples. The other procedure utilizes the NRLXRF program and produces correct results for thin and thick films.

Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry