Original paper
Kinetic Analysis of Spontaneous Whisker Growth on Pre-treated Surfaces with Weak Oxide
Abstract
This study sought to clarify the relationship between cracks in surface oxide layers and the growth behavior of tin whiskers. The number, length, and total volume of extrusions were precisely calculated and residual stress was measured using synchrotron radiation x-ray diffractometry. The aim was to elucidate the influence of stress on the driving force and flux involved in atomic diffusion. The distance between weak spots was shown to be the...
Paper Details
Title
Kinetic Analysis of Spontaneous Whisker Growth on Pre-treated Surfaces with Weak Oxide
Published Date
May 24, 2014
Volume
43
Issue
9
Pages
3290 - 3295
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Notes
History