Original paper
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
Abstract
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the range from hundreds of nanonewtons to a few micronewtons. Such large forces can cause sample damage and preclude direct measurement of ultrathin films or nanofeatures. Here, we present a contact resonance spectroscopy AFM technique that utilizes a cantilever's higher flexural...
Paper Details
Title
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
Published Date
Jan 11, 2012
Journal
Volume
23
Issue
5
Pages
055702 - 055702
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Notes
History