A new method for the model‐independent assessment of thickness in three‐dimensional images

Three‐dimensional (3‐D) structural parameters derived from lower‐dimensional measurements using indirect morphometric methods may be strongly biased if the measured objects deviate from the assumed structure model. With the introduction of 3‐D microscopic measuring techniques it is possible to obtain a complete depiction of complex spatial structures. As a consequence, new 3‐D methods have recently been developed for the estimation of...