Miguel Angelo do Amaral Junior
National Institute for Space Research
Etching (microfabrication)Analytical chemistryDissipationCrystalliteElectromagnetic radiationDeposition (phase transition)AdsorptionRadiationComposite materialWaferTextilePermittivityNanotechnologyElectromagnetic interferenceNanostructureMaterials scienceIonizationRaw materialCurrent densityAnodizingElectromagnetic shieldingPhononParticulatesScanning electron microscopeCondensed matter physicsPolyacrylonitrileEvent (relativity)Porous siliconAnomaly (natural sciences)Activated carbonEnvironmental scienceRaman spectroscopyNickelFiberPorositySurface finishMicroporous materialSudden stratospheric warmingAtmospheric sciences
6Publications
2H-index
30Citations
Publications 6
Newest
Abstract Nickel coated activated carbon fiber felt (Ni-ACFF) are known as excellent materials for electrostatic dissipation and electromagnetic interference (EMI) shielding. The deposition of metallic nickel on ACFF was investigated to obtain reproducible and singular materials capable of electromagnetic radiation shielding from 8.2 to 12.4 GHz (X-band). Homogeneous films and fixed quantity of nickel with simple processability were obtained by using the electrodeposition method controlling the e...
8 CitationsSource
2 Citations
#1Miguel Angelo do Amaral Junior (INPE: National Institute for Space Research)H-Index: 2
#2J.T. MatsushimaH-Index: 13
Last. Maurício Ribeiro BaldanH-Index: 25
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This paper presents the preparation and characterization of carbon fiber felt and activated carbon fiber felt from textile polyacrylonitrile fiber. Carbon fibers are usually related to aircraft manufacturing or high mechanical purposes. Activated carbon fibers are known as excellent adsorbent materials. Despite all advantages, carbon fiber and activated carbon fiber are expensive materials because of their raw material cost. On the other hand, in this study, carbon fiber felt and activated carbo...
19 CitationsSource
Last. Maurício Ribeiro Baldan (INPE: National Institute for Space Research)H-Index: 25
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Porous silicon samples were obtained by the anodization etching process of a n-type silicon wafer. The pores formation was investigated taking into account the anodization time. Scanning Electron Microscopy and Optical Profilometry were used to characterize the morphology, pore size, pore depth, thickness, roughness, surface area and also the morphological evolution of porous silicon layer. The formed porous silicon layer showed a tendency to increase the pore size, pore depth, roughness and sur...
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Last. Maurício Ribeiro BaldanH-Index: 2
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Porous silicon samples, obtained by electrochemical process in a solution containing HF-Ethanol were prepared varying etching time and current density. Using the phonon confinement model the crystallite size was estimated on the porous layer through the best fit of the Raman spectrum of first order. The experimental and theoretical points were better adjusted in order to obtain more accurate results in relation to previous works. For the samples with varying the anodization time and keeping cons...
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#1R. R. PaesH-Index: 6
#2Inez S. BatistaH-Index: 53
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