Electrical engineering

Physics

Transistor

Structural engineering

Engineering

Soft error

Voltage

Embedded system

Power (physics)

Electronic engineering

Single event upset

Upset

Computer science

Quantum mechanics

Static random-access memory

Computer hardware

Node (physics)

Mechanical engineering

IEEE Transactions on Circuits and Systems I Regular Papers

With the advancement of technology, the size of transistors and the distance between them are reducing rapidly. Therefore, the critical charge of sensitive nodes is reducing, making SRAM cells, used for aerospace applications, more vulnerable to soft-error. If a radiation particle strikes a sensitive node of the standard 6T SRAM cell, the stored data in the cell are flipped, causing a single-event upset (SEU). Therefore, in this paper, a Soft-Error-Aware Read-Stability-Enhanced Low-Power 12T (SARP12T) SRAM cell is proposed to mitigate SEUs. To analyze the relative performance of SARP12T, it is compared with other recently published soft-error-aware SRAM cells, QUCCE12T, QUATRO12T, RHD12T, RHPD12T and RSP14T. All the sensitive nodes of SARP12T can regain their data even if the node values are flipped due to a radiation strike. Furthermore, SARP12T can recover from the effect of single-event multi-node upsets (SEMNUs) induced at its storage node-pair. Along with these advantages, the proposed cell exhibits the highest read stability, as the '0'-storing storage node, which is directly accessed by the bitline during read operation, can recover from any upset. Furthermore, SARP12T consumes the least hold power. SARP12T also exhibits higher write ability and shorter write delay than most of the comparison cells. All these improvements in the proposed cell are obtained by exhibiting only a slightly longer read delay and consuming slightly higher read and write energy.

Soft-Error-Aware Read-Stability-Enhanced Low-Power 12T SRAM With Multi-Node Upset Recoverability for Aerospace Applications