Physics

Energy filtered transmission electron microscopy

Nanotechnology

Organic chemistry

Scanning transmission electron microscopy

Characterization (materials science)

Analytical Chemistry (journal)

Engineering

Transmission electron microscopy

X-ray photoelectron spectroscopy

Mass spectrometry

Auger electron spectroscopy

Nuclear physics

Chemistry

Static secondary-ion mass spectrometry

Materials science

Molecule

Silicon

Polymer characterization

Secondary Ion Mass Spectroscopy

Time of flight

Electron spectroscopy

Chemical engineering

Chromatography

Polymer

Secondary ion mass spectrometry

Journal of Applied Polymer Science

Time of flight‐secondary ion mass spectrometry (ToF‐SIMS) is a SIMS based surface sensitive technique that provide specific compound identification of surface molecules. Recently, the importance of ToF‐SIMS has grown for the characterization and utilization of polymers, pharmaceuticals, semi‐conductors. The compound specificity of ToF‐SIMS distinguishes it from other surface characterization techniques such as X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and so forth, making it a preferred tool for the effective surface analysis of polymers. The purpose of this review is to elucidate the capability of ToF‐SIMS technique to effectively analyze the surface chemistry of polymer materials.

Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review