Defect detection in pipes using Van der Pol systems based on ultrasonic guided wave

Volume: 195, Pages: 104577 - 104577
Published: Feb 1, 2022
Abstract
The sensitivity of small defect detection and the location of small defect in pipes are the main difficulties of the present ultrasonic guided wave inspection technology. A Van der Pol (VdP) chaotic system's sensitivity to initial conditions and capability of being immune to noise was used to establish the relationship between local defect positions and chaos damage factors in this paper. Simulation studies of phase trajectory and Lyapunov...
Paper Details
Title
Defect detection in pipes using Van der Pol systems based on ultrasonic guided wave
Published Date
Feb 1, 2022
Volume
195
Pages
104577 - 104577
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