Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Fuel7.50
Volume: 286, Pages: 119373 - 119373
Published: Oct 23, 2020
Paper Details
Title
Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Published Date
Oct 23, 2020
Journal
Volume
286
Pages
119373 - 119373
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