Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Here, kerogens of differing heat treatments are subjected to extremely high dissociation energies by sample bombardment by 25 keV Bi3+ primary ions during analysis by time-of-flight secondary ion mass spectrometry (TOF-SIMS). Positive and negative secondary ions are produced from this decomposition and fragment ion distributions of model compounds and kerogens are compared and starkly different results are obtained for cations versus anions....