Pulsed Force Kelvin Probe Force Microscopy

Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges. Kelvin probe force microscopy (KPFM), an imaging technique of atomic force microscopy, has been widely used for surface potential and work function mapping at the nanoscale. However, the conventional KPFM variants are often limited in their spatial resolution to 30-100 nm under...