Quantum mechanics

Engineering

Reliability engineering

Operating system

Digital electronics

Power (physics)

Computer science

Fault (geology)

Seismology

Electronic circuit

Geology

Software

Physics

Fault injection

Integrated circuit

Electronic engineering

Computer engineering

Reliability (semiconductor)

Programming language

Electrical engineering

Integration

One of the most popular methods for reliability assessment of digital circuits is Fault Injection (FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we present a survey of FI techniques as well as classifying these techniques considering different aspects and criteria to bring out their similarities and differences. The goal of this paper is to help the researchers and reliable circuit designers in gaining insights into the state-of-art in FI techniques and motivate them to further improve these techniques for more efficient reliability evaluation of digital circuit designs of tomorrow.

A survey on fault injection methods of digital integrated circuits