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doi.org/10.1103/physrevb.101.104302
Original paper
Measurement-induced criticality in random quantum circuits
Chao‐Ming Jian
24
,
Yi‐Zhuang You
35
,
...,
Andreas Ludwig
40
View all 4 authors
Physical review. B./Physical review. B
3.70
Volume: 101, Issue: 10
Published
: Mar 3, 2020
310
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Paper Fields
Quantum mechanics
Law
Entropy (arrow of time)
Scaling
Statistical physics
Universality (dynamical systems)
Physics
Quantum entanglement
Mathematics
Political science
Unitary state
Mathematical analysis
Geometry
Quantum
Conformal field theory
Conformal map
Paper Details
Title
Measurement-induced criticality in random quantum circuits
DOI
doi.org/10.1103/physrevb.101.104302
Published Date
Mar 3, 2020
Journal
Physical review. B./Physical review. B
Volume
101
Issue
10
Notes
History
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