Feature (linguistics)

Software product line

Mathematics

Software development

Algorithm

Data mining

Filter (signal processing)

Philosophy

Sampling (signal processing)

Programming language

Geometry

Software

Computer science

Linguistics

Theoretical computer science

Product (mathematics)

Computer vision

Scalability

Database

Efficiently testing large configuration spaces of Software Product Lines (SPLs) needs a sampling algorithm that is both scalable and provides good t-wise coverage. The 2019 SPLC Sampling Challenge provides large real-world feature models and asks for a t-wise sampling algorithm that can work for those models.

<i>t</i> -wise Coverage by Uniform Sampling

t -wise Coverage by Uniform Sampling