In situ through-thickness analysis of crack tip fields with synchrotron X-ray diffraction

Volume: 127, Pages: 500 - 508
Published: Oct 1, 2019
Abstract
In this work a novel approach to estimate in situ the stress intensity factor (SIF) through the thickness of metal specimens is presented. It is based on a hybrid methodology that combines powerful synchrotron X-ray diffraction data with an elastic analytical model describing the strain field around the crack tip. A sensitivity analysis is conducted to understand the largest sources of error and their impact on the estimated SIF values. The...
Paper Details
Title
In situ through-thickness analysis of crack tip fields with synchrotron X-ray diffraction
Published Date
Oct 1, 2019
Volume
127
Pages
500 - 508
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