High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors
Volume: 27, Issue: 4, Pages: 821 - 829
Published: Dec 12, 2018
Paper Details
Title
High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors
Published Date
Dec 12, 2018
Volume
27
Issue
4
Pages
821 - 829
Notes
History