Mechanism (biology)

Quantum mechanics

Algorithm

Reliability theory

Voltage

Engineering

Reliability engineering

Statistics

Failure mechanism

Binary decision diagram

Telecommunications

Power (physics)

Computer science

Classical mechanics

Mechanical engineering

Thermodynamics

Physics

Mathematics

Degradation (telecommunications)

Reliability (semiconductor)

Structural engineering

Monte Carlo method

Acceleration

Failure rate

Electric shock

Electrical engineering

IEEE Access

In this paper, we propose a failure mechanism cumulative model that considers the loading history of the load sharing effect in a k-out-of-n system. Three types of failure mechanisms are considered, continuous degradation, compound point degradation, and sudden failure due to shock. By constructing a logic diagram with functional dependence gate, the load-sharing effect can be explained from the failure mechanism point of view using a mechanism-acceleration gate that shows that when one component fails, the failure mechanisms of the other surviving components will be accelerated. By deriving the total damage equation and a constructing failure behavior model, the system reliability of a k-out-of-n system with different types of failure mechanisms were evaluated. A voltage stabilizing system that contains a 1-out-of-2 subsystem, or a 2-out-of 3 subsystem was used to illustrate the practical applicability of the proposed approach. A combined Monte Carlo and binary decision diagram method was used in the numerical simulation process.

A Failure Mechanism Cumulative Model for Reliability Evaluation of a k-Out-of-n System With Load Sharing Effect