Electrical engineering

Logic gate

Algorithm

Electronic circuit

Engineering

Automatic test pattern generation

Computer science

The globalization of IC supply chain lead to the emergence of hardware security threats such as IP piracy, reverse engineering, overbuilding, and hardware Trojans. Among the techniques developed to mitigate these threats, logic locking offers the most versatile protection and is being actively researched. The most recent locking technique SFLL thwarts with provable and quantifiable security all the state-of-the-art attacks including SAT, AppSAT, and the removal attack. However, the implementation cost of SFLL can sometimes be prohibitive, as it lacks an automated framework that explores cost-effective implementation options. In this paper, we show how VLSI testing principles and tools can be adopted to automate critical steps in SFLL and minimize its cost. We propose "SFLL-fault" that utilizes fault injection driven synthesis to efficiently explore design options and ATPG to assess security levels. Our experimental results confirm the efficacy of our strategy; SFLL-fault can reduce the implementation cost by 35% compared to SFLL without compromising security.

ATPG-based cost-effective, secure logic locking