Beam (structure)

Engineering

Beamline

Neutron source

Nuclear physics

Computer science

Microelectronics

Neutron

Physics

Nuclear engineering

Project commissioning

Irradiation

Optics

Political science

Electronics

Spallation Neutron Source

Chip

Optoelectronics

Publishing

Electrical engineering

Journal of Physics Conference Series

ChipIr is a new beamline at the ISIS spallation source dedicated to accelerated testing of microelectronics. ChipIr features an atmospheric-like neutron spectrum to study the so-called Single Event Effects, a major concern for the reliability of modern electronics at ground level and flight altitudes. A bespoke design was needed to extract a fast neutron beam from a neutron source designed for thermal neutron applications.

Progress of the Scientific Commissioning of a fast neutron beamline for Chip Irradiation