Dynamic white-light interferometry via multiwavelength tilt iteration and sliding local least squares
Abstract
The growing interest in microprofile measurements for advanced semiconductor manufacturing and electronic glass screens has stimulated the demand for in situ dynamic white-light interferometry (DWLI). However, it is challenging to perform vibration-insensitive measurements because of the broad-spectrum interference. In this Letter, we report a vertical scanning DWLI using multiwavelength tilt iteration and sliding local least squares. Numerical...
Paper Details
Title
Dynamic white-light interferometry via multiwavelength tilt iteration and sliding local least squares
Published Date
Nov 19, 2021
Journal
Volume
46
Issue
23
Pages
5810 - 5810
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