doi.org/10.1016/j.microrel.2021.114384
Other

A physical lifetime prediction methodology for IGBT module by explicit emulation of solder layer degradation

..., Guoyou Liu
15
Microelectronics Reliability1.60
Volume: 127, Pages: 114384 - 114384
Published: Sep 28, 2021
Paper Fields
Paper Details
Title
A physical lifetime prediction methodology for IGBT module by explicit emulation of solder layer degradation
DOI
doi.org/10.1016/j.microrel.2021.114384
Published Date
Sep 28, 2021
Journal
Microelectronics Reliability
Volume
127
Pages
114384 - 114384
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