Multimode metrology via scattershot sampling
Abstract
The authors study the application of scattershot single-photon sources to multimode quantum metrology by investigating three different kinds of interferometers. They show that all three of them give the same average amount of information, but two of the three need to be in specific input configurations while the third one always beats the classical limit regardless of the input...
Paper Details
Title
Multimode metrology via scattershot sampling
Published Date
Sep 13, 2021
Journal
Volume
104
Issue
3
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