A Comparative Study on Misorientations to Determine the Extent of Recrystallization in Pure ETP Copper

In electron backscatter diffraction (EBSD), kernel average misorientation (KAM), grain average misorientation (GAM), and grain orientation spread (GOS) are considered as the reflection of the extent of recrystallization. This work presents a comparative study of KAM, GAM, and GOS to bring out the best-suited parameter to determine the extent of recrystallization in pure copper. The pure ETP (electrolytic tough pitch) copper samples were...