Ultrashort, MeV-scale laser-plasma positron source for positron annihilation lifetime spectroscopy

Sub-micron defects represent a well-known fundamental problem in manufacturing since they can significantly affect performance and lifetime of virtually any high-value component. Positron annihilation lifetime spectroscopy is arguably the only established method capable of detecting defects down to the sub-nanometer scale but, to date, it only works for surface studies, and with limited resolution. Here, we experimentally and numerically show...