The significance of the spectral correction of photon counting detector response in material classification from spectral x-ray CT

Photon counting imaging detectors (PCD) has paved the way for the emergence of Spectral X-ray Computed Tomography (SCT), which simultaneously measures a material’s linear attenuation coefficient (LAC) at multiple energies defined by the energy thresholds. In previous work SCT data was analysed with the SIMCAD method for material classifications. The method measures system-independent material properties such as electron density,...