Single-Shot Phase Measuring Profilometry Based on Quaternary Grating Projection

In this paper, we propose a new single-shot three-dimensional (3D) measuring method based on quaternary grating projection. In traditional binary grating phase measuring profilometry (PMP), a multi-step or color fringe pattern are usually used to extract the sinusoidal fringes. In our proposed method, by using the DLP4500’s 2-bit gray coding mode, the grayscale is quaternary. The three non-zero grayscales cyclically arranged in equal width, and...