Characterizing Midcircuit Measurements on a Superconducting Qubit Using Gate Set Tomography

Volume: 17, Issue: 1
Published: Jan 12, 2022
Abstract
Key applications of quantum computing, including error correction, rely critically on the capability to measure (read out) the state of selected quantum bits, without disturbing other qubits or terminating the computation. Such m\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}d\phantom{\rule{0}{0ex}}c\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}r\phantom{\rule{0}{0ex}}c\phantom{\rule{0}{0ex}}u\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}t..
Paper Details
Title
Characterizing Midcircuit Measurements on a Superconducting Qubit Using Gate Set Tomography
Published Date
Jan 12, 2022
Volume
17
Issue
1
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